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Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by “feeling” or “touching” the surface with a mechanical probe. An AFM probe has a sharp tip on the free-swinging end -
Table Of Content
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Table of Content
1 Industry Overview
1.1 AFM Probe Industry
1.1.1 Overview
1.1.2 Development of AFM Probe
1.2 Market Segment
1.2.1 Upstream
1.2.2 Downstream
1.3 Cost Analysis
2 Industry Environment
2.1 Policy
2.2 Economics
2.3 Sociology
2.4 Technology
3 AFM Probe Market by Type
3.1 Segment Overview
3.1.1 Silicon AFM Probes -
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