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Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by “feeling” or “touching” the surface with a mechanical probe. An AFM probe has a sharp tip on the free-swinging end
Table of Content
1 Industry Overview
1.1 AFM Probe Industry
1.1.1 Overview
1.1.2 Products of Major Companies
1.2 Market Segment
1.2.1 Industry Chain
1.2.2 Consumer Distribution
1.3 Price & Cost Overview
2 AFM Probe Market by Type
2.1 By Type
2.1.1 Silicon AFM Probes
2.1.2 Silicon Nitride AFM Probes
2.1.3 Diamond AFM Probes