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Atomic-force microscopy (AFM) or scanning-force Microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
The global Atomic Force Microscope market will reach Volume Million USD in 2017 and CAGR xx% 2011-2017. The report begins fr
Table of Content
1 Industry Overview
1.1 Atomic Force Microscope Industry
1.1.1 Overview
1.1.2 Development of Atomic Force Microscope
1.2 Market Segment
1.2.1 Upstream
1.2.2 Downstream
1.3 Cost Analysis
2 Industry Environment
2.1 Policy
2.2 Economics
2.3 Sociology
2.4 Technology
3 Atomic Force Microscope Market by Type
3.1 Segment Ove