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Film Thickness Measuring Systems can measure and analysis of single layer and/or multilayer films in less than a second. The optical properties are obtained from reflection and thickness is measured by detecting the sinusoidal fringe pattern from the sample?s specular reflectance.Thin film measurement instrumentation has evolved from complex, difficult to use systems to today?s compact, p
Table of Content
1 Industry Overview
1.1 Film Thickness Measuring System Industry
1.1.1 Overview
1.1.2 Products of Major Companies
1.2 Market Segment
1.2.1 Industry Chain
1.2.2 Consumer Distribution
1.3 Price & Cost Overview
2 Film Thickness Measuring System Market by Type
2.1 By Type
2.1.1 Thickness Monitor
2.1.2 Spectrum Ellipsometer